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Nanoparticles Newsletter
August 2006
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The Nano-Rp® nanoparticle characterization system wins fans! Professor M. Mecartney at the University of California, Irvine, says, "PNI has identified a critical need in nanoscale technology and measurements in the real world and responded with a unique approach to easily and reliably measure and characterize nanoparticles" ... full press release |
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The Nanoparticle image gallery has been updated. A large variety of nanoparticle structures can be analyzed by AFM. PNI AFM products have the versatility to measure the topographical features of nanoparticles from only a few nanometers to several microns in height. Physical properties such as adhesion and elasticity can be mapped as well ...see more. |
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